Arrangement for monitoring the emission wavelength of a laser source
AssigneeAgilent Technologies, Inc.
InventorDaoning Su
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorDaoning Su
Estimating the term…
An arrangement for monitoring the emission wavelength of a laser source (10) emitting a main radiation beam to be launched into an optical waveguide (F) includes a wavelength selective photosensitive element (20, 22) adapted to be exposed to the radiation beam to generate an output signal (20a) indicative of the wavelength of the radiation. The arrangement comprises an optical system (12, 14, 16) defining a beam propagation path for the radiation beam towards the waveguide (F). The wavelength selective photosensitive element (20, 22) is arranged at a marginal position of the beam, to collect at least a corresponding marginal portion of the radiation beam, whereby the signal (20a) indicative of the wavelength of the radiation is generated from said marginal portion of the radiation beam in the optical system (12, 14, 16).
An arrangement for monitoring the wavelength of a radiation beam emitted by a laser source (10), the arrangement including a wavelength selective photosensitive element (20, 22) adapted to be exposed to said radiation beam to generate an output signal (20a) indicative of the wavelength of said radiation, characterized in that:
The arrangement of any of the previous claims, characterised in that said wavelength selective photosensitive element (20, 22) includes a photodiode (20) having associated therewith a wavelength selective optical filter (22).
The arrangement of any of the preceding claims, characterised in that said optical systems includes at least one lens (12, 14) of refractive, reflective and diffractive nature, or a combination of them.
Dependencies are inferred from the claim text.