Method of measuring a pattern of electromagnetic radiation
AssigneeLucent Technologies Inc.
InventorGoran M. Djuknic
Life of this patent
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Abstract
A method of measuring a pattern of electromagnetic radiation. A plurality of scattered electromagnetic radiation samples are sensed from a transmitted signal formed from electromagnetic radiation. Thereafter, an antenna pattern from the scattered electromagnetic radiation samples is developed. Each scattered sample includes two-dimensional information corresponding with the power detected at a specific coordinate. The scattered samples may be arranged in a matrix, enabling a three-dimensional beamshape of the antenna pattern-to be formulated.
Claims20
A method of measuring a pattern of electromagnetic radiation comprising:
- sensing at least two scattered electromagnetic radiation samples from a transmitted signal comprising electromagnetic radiation;
- and
- developing a pattern of electromagnetic radiation from the at least two scattered electromagnetic radiation samples.
A method of measuring the characteristics of an antenna comprising:
- sensing scattered electromagnetic radiation from a signal comprising electromagnetic radiation transmitted by a source using the antenna;
- creating a matrix of scattered two-dimensional electromagnetic radiation sensing samples from the sensed scattered electromagnetic radiation;
- and
- developing a pattern of electromagnetic radiation of the antenna from the matrix of scattered samples.
A system for measuring a pattern of electromagnetic radiation comprising:
- at least one sensor for detecting a plurality of two-dimensional scattered electromagnetic radiation samples from a transmitted signal comprising electromagnetic radiation;
- and
- a processor for developing the pattern of electromagnetic radiation from the plurality of two-dimensional scattered electromagnetic radiation samples.
Dependencies are inferred from the claim text.