Exhaust system for processing apparatus
OwnerWataru Okase, Noriaki Matsushima +3inventors
InventorsWataru Okase, Noriaki Matsushima, Akihiko Tsukada, Akihiko Hiroe, Kouji Shimomura
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OwnerWataru Okase, Noriaki Matsushima +3inventors
InventorsWataru Okase, Noriaki Matsushima, Akihiko Tsukada, Akihiko Hiroe, Kouji Shimomura
Estimating the term…
In an exhaust system for a processing apparatus wherein a processing gas is used to subject a semiconductor wafer W to be processed to a predetermined processing, a vacuum exhaust pathway 40 having a vacuum pump 42 is connected to the processing apparatus 20. A trap mechanism 52 for removing reaction products that flow into the vacuum exhaust pathway 40 is provided within the vacuum exhaust pathway 40, via disconnectable connection flanges 78 and 86 on the upstream side of the vacuum pump 42. An upstream-side inlet portion and an outlet portion of this trap mechanism 52 are provided with isolation valves 80 and 88 that can place the interior of the trap mechanism in a hermetically sealed state when necessary. A bypass pathway 54 is provided to allow a cleaning gas to bypass the trap mechanism 52 during the cleaning of the processing apparatus 20. It is possible to perform maintenance work without exposing the interior of the trap mechanism 52 to the atmosphere by separating the connection flanges 78 and 86 and then removing the trap mechanism 52.
An exhaust system for a processing apparatus for subjecting an object to be processed to a predetermined processing with a processing gas, said exhaust system comprising:
Dependencies are inferred from the claim text.