Processing semiconductor devices having some defective input-output pins
AssigneeMicron Technology, Inc.
InventorsDavid Charlton, Sovandy Prak
Life of this patent
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Abstract
Techniques to process semiconductor devices whose input-output (I/O) pins are only partially operative is able to accommodate substantially all possible combinations of operative I/O pin patterns. Semiconductor devices are tested to determine which I/O pins are operative. A code representing which I/O pins are operative is then associated with each tested device. The generated codes are used to selectively combine two or more semiconductor devices to form a component capable of providing the function of a single fully operational semiconductor device.
Claims17
A method to process partially defective devices each having plural pins, comprising:
- testing the devices to identify which pins are operational and which pins are inoperational;
- storing a code indicating an operational status of the pins;
- and
- prior to assembling the devices into a module, verifying the operational status of at least the pins indicated by the code as being operational.
A program storage device, readable by a programmable control system, comprising instructions that when executed cause the programmable control system to:
- test devices to identify which pins of the devices are operational and which pins are inoperational;
- store a code indicating an operational status of the pins;
- and
- verify the operational status of at least the pins of the devices indicated by the code as being operational prior to assembling the devices into a module.
A test system comprising:
- a first tester to test devices to identify which pins are operational and which pins are inoperational;
- a storage to store a code indicating an operational status of the pins;
- and
- a second tester to verify the operational status of at least the pins indicated by the code as being operational prior to assembling the devices into a module.
Dependencies are inferred from the claim text.