Waveform measuring instrument using equivalent time sampling
AssigneeYokogawa Electric Corporation
InventorsTakuya Saitou, Shigeru Takezawa
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Abstract
The present invention is intended to provide a waveform measuring instrument whose waveform reproducibility in the equivalent time sampling system is improved. The present invention is characterized by that, in a waveform measuring instrument configured so that the repeated waveform data items are acquired and sent to the acquisition memory by means of the equivalent time sampling, the above acquisition memory is divided into a plurality of time slot regions corresponding to the interval of equivalent time sampling and a plurality of memory address groups is assigned to each time slot region.
Claims4
A waveform measuring instrument configured so that the repeated waveform data items are acquired by an acquisition memory using equivalent time sampling:
- in which said acquisition memory is divided into a plurality of time slot regions corresponding to an interval of equivalent time sampling and a plurality of memory address groups is assigned to each time slot region.
Dependencies are inferred from the claim text.