Semiconductor device and production method therefor
AssigneeSony Corporation
InventorsTakeshi Nogami, Naoki Komai, Hideyuki Kito, Mitsuru Taguchi
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AssigneeSony Corporation
InventorsTakeshi Nogami, Naoki Komai, Hideyuki Kito, Mitsuru Taguchi
Estimating the term…
A semiconductor device capable of suppressing diffusion of copper at an interface between a copper wire and a cap film to enhance an electromigration resistance to ensure reliability of the copper wire, and a manufacturing method thereof are provided. The semiconductor device according to the present invention comprises an insulating film (12) formed on a substrate (11), a concave portion (13) (for example, a groove) formed in the insulating film, a conductive layer (15) embedded in the concave portion through a barrier layer (14), and a cobalt tungsten phosphorus coating (16) to connect with the barrier layer on the side of the conductive layer and to coat the conductive layer on the opening side of the concave portion.
A semiconductor device comprising:
A method of manufacturing a semiconductor device comprising the steps of:
Dependencies are inferred from the claim text.