Methods of ball grid array
AssigneeMicron Technology, Inc.
InventorsTongbi Jiang, Salman Akram
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicron Technology, Inc.
InventorsTongbi Jiang, Salman Akram
Estimating the term…
A ball grid array for a flip-chip assembly. The ball grid array includes a plurality of bumps bonded between an active surface of a semiconductor die and a top surface of a printed circuit board or any type of substrate carrier. The plurality of balls include at least one bump having a core material and an outer layer. The rigidity of the core material is greater than that of the material of the outer layer. Additionally, the melting temperature of the core material is higher than the material of the outer layer. By this arrangement, the core material with an outer layer provides bumps that are substantially uniform in height. In addition, the balls only procure marks or deformation to the core material during burn-in testing and reflow. Therefore, when bonding the semiconductor device to the substrate, the ball grid array provides sufficient electrical and mechanical connection despite any non-planarity in the active surface of the semiconductor device and the top surface of the substrate, and any differing height in the plurality of balls due to testing the semiconductor device.
A method for connecting a semiconductor device having an active surface having at least one bond pad thereon, said at least one bond pad having a layer of solder on at least a portion thereof, to a substrate having a surface having at least one contact thereon, said contact having a layer of solder on at least a portion thereof, said method comprising:
A method for making a flip-chip assembly, the method comprising:
A method for preparing a flip-chip assembly, the method comprising:
A method for preparing a plurality of balls for a flip-chip assembly, the method comprising:
Dependencies are inferred from the claim text.