Semiconductor integrated circuit including a plurality of macros that can be operated although their operational voltages are different from each other
AssigneeNEC Electronics Corporation
InventorIsao Naritake
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Abstract
A semiconductor integrated circuit, includes a first macro and a second macro. The first macro outputs a data signal. The second macro inputs the data signal. The first macro fixes the data signal at a non-high level state that is not a high level in response to a control signal.
Claims20
A semiconductor integrated circuit, comprising:
- a first macro outputting a data signal;
- and
- a second macro inputting said data signal, and
- wherein said first macro fixes said data signal at a non-high level state that is not a high level in response to a control signal.
A semiconductor integrated circuit, comprising:
- a first macro having an output buffer outputting a data signal;
- and
- a second macro inputting said data signal, wherein a second power supply voltage is supplied to said second macro, and
- wherein said second power supply voltage is supplied to said output buffer, and
- wherein said output buffer outputs said data signal such that an amplitude of said data signal is substantially equal to that of said second power supply voltage.
A semiconductor integrated circuit, comprising:
- a first macro outputting a data signal;
- and
- a second macro inputting said data signal, and
- wherein said second macro includes:
- an input buffer inputting said data signal;
- a logic circuit inputting an input data signal, wherein said input buffer outputs said input data signal in correspondence with said data signal, and
- wherein said input buffer includes a first MOS transistor, and
- wherein said logic circuit includes a second MOS transistor, and
- wherein a first gate oxide film included in said first MOS transistor is thicker than a second gate oxide film included in said second MOS film.
A semiconductor integrated circuit, comprising:
- a first macro outputting an output data signal;
- a level shifter adjusting an amplitude of said output data signal in response to a control signal indicating whether or not a burn-in is performed on said semiconductor integrated circuit to generate an input data signal;
- and
- a second macro inputting said input data signal.
An operating method of a semiconductor integrated circuit, comprising:
- (a) inputting a control signal indicating whether or not a burn-in is performed on a semiconductor integrated circuit;
- and
- (b) outputting a data signal, and
- wherein said (b) includes (c) fixing said data signal at non-high level state that is not a high level in response to said control signal when said burn-in is performed on said semiconductor integrated circuit.
An operating method of a semiconductor integrated circuit, comprising:
- (d) supplying a first power supply voltage to a first macro;
- and
- (e) outputting a data signal from said first macro to a second macro, and
- wherein said (e) includes (f) fixing said data signal at a non-high level state that is not a high level when said first power supply voltage is higher than a maximum rated voltage of said second macro.
An operating method of a semiconductor integrated circuit, comprising:
- (g) supplying a power supply voltage;
- and
- (h) outputting a data signal, and
- wherein said (h) includes (i) fixing said data signal at a non-high level than is not a high level when said power supply voltage is lower than a predetermined standard voltage.
An operating method of a semiconductor integrated circuit, comprising:
- (j) supplying a first power supply voltage to a portion other than an output buffer of a first macro including said output buffer;
- (k) supplying a second power supply voltage to a second macro and said output buffer;
- and
- (l) outputting a data signal of which an amplitude is substantially equal to that of said second power supply voltage from said output buffer to said second macro.
An operating method of a semiconductor integrated circuit, comprising:
- (m) outputting an output data signal:
- (n) inputting a control signal indicating whether or not a burn-in is performed on a semiconductor integrated circuit;
- and
- (o) adjusting an amplitude of said output data signal in response to said control signal to generate an input data signal.
Dependencies are inferred from the claim text.