Polarization dependent loss measuring apparatus
AssigneeAndo Electric Co., Ltd.
InventorKiyohisa Fujita
Life of this patent
Estimating the term…
Loading patent…
AssigneeAndo Electric Co., Ltd.
InventorKiyohisa Fujita
Estimating the term…
Wavelength dependent measurement is made by launching light into an object 8 to be measured and receiving transmitted light from the object 8 while continuously changing wavelengths of output light. Next, peak wavelength detection processing for detecting a wavelength at the time when loss or gain of the transmitted light from the object 8 becomes maximum based on a wavelength dependent measurement result is performed. Then, polarization dependent loss measurement processing for measuring polarization dependent loss of the object 8 is performed by measuring the transmitted light from the object 8 while launching light of a measurement wavelength detected into the object 8 and randomly changing a polarization state of the light. Further, a control circuit processes associating a wavelength dependent analysis result with a PDL measurement result, and displays its result on a display part 2.
A polarization dependent loss measuring apparatus comprising:
A polarization dependent loss measuring apparatus comprising:
Dependencies are inferred from the claim text.