Device and system for detecting abnormality
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsReiko Ueno, Noriko Kaneda, Takashi Omori, Kousuke Hara, Hiroshi Yamamoto, Shigeyuki Inoue, Shinji Tanaka
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AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsReiko Ueno, Noriko Kaneda, Takashi Omori, Kousuke Hara, Hiroshi Yamamoto, Shigeyuki Inoue, Shinji Tanaka
Estimating the term…
An abnormality detection device 30 includes small motion sensors 25a˜25c that detect small motions of a person in a house, a data collecting unit 32 that collects and stores sensor signals from the small motion sensors 25a˜25c as sensor patterns, a Markov chain operating unit 33 that transforms the sensor patterns into a cluster sequence by vector-quantizing input patterns which are obtained by averaging and normalizing the sensor patterns and calculates a transition number matrix and a duration time distribution of a Markov chain and so on using a Markov chain model, a comparing unit 34 that calculates characteristic amount (Euclid distance and average log likelihood in appearance frequency of a Markov chain and average log likelihood to the duration time distribution of a Markov chain) of a sample activity as against a daily activity based on the obtained transition number matrix and the duration time distribution and so on, and others.
An abnormality detection device that detects occurrence of abnormality in an event under observation, comprising:
An abnormality detection system comprising:
An abnormality detection system comprising:
An abnormality detection method for detecting occurrence of abnormality in an event under observation, comprising:
A program for detecting that abnormality has occurred in an event under observation, the program causing a computer to execute:
Dependencies are inferred from the claim text.