Low-current pogo probe card

A method for custom assembling a pogo probe card for testing a predetermined set of probing sights resident on a predetermined integrated circuit type, to fully utilize the number of pogo pin receptive pad sets available, comprising:

• determining the number, location and relative sensitivity
• providing a pogo probe card workpiece, including:
• (a) a laminate board including a first dielectric layer, a second dielectric layer and a conductive layer interposed between said first dielectric layer and said second dielectric layer, said board forming an opening and having a first and a second major surface;
• (b) a plurality of probing devices for probing a plurality of probing sites on a test device, each probing device including an elongate probing needle and an electrical connection arm electrically connected to the probing needle, said probing devices being mounted to the first major surface in radial arrangement about said opening, extend into said opening and traverse a plane defined by the second major surface, so that said probing needles terminate in a pattern suitable for probing said sites;
• (c) a plurality of pogo pin receptive pad sets each pad set including a force line pad, a sense line pad and a guard line pad that surrounds both said sense line pad and said force line pad;
• and
• (d) a set of first conductors for electrically connecting each guard line pad to said conductive layer;
• and
• electrically connecting both the sense line pad and the force line pad of a first pogo pin receptive pad set to a first electrical connection arm;
• electrically connecting only the force line pad of a first pogo pin receptive pad set to an electrical connection arm adapted to be connected to a first test site;
• and
• electrically connecting only the sense line pad of a second pogo pin receptive pad set to an electrical connection arm that is adapted to be connected to the first test site.