Back to results
US 2003/0117148 A1Published application
Detection of a variation in the environment of an integrated circuit
AssigneeSTMicroelectronics S.r.l.
InventorsSylvie Wuidart, Luc Wuidart, Michel Bardouillet, Pierre Balthazar
Life of this patent
Estimating the term…
Abstract
A method and a circuit for detecting variations of at least one environmental parameter of an integrated circuit, including evaluating a propagation delay of an edge in delay elements sensitive to variations of the environmental parameter, and comparing the present or measured delay with at least one reference value.
Claims12
A method for detecting variations of at least one environmental parameter of an integrated circuit, comprising:
- evaluating a propagation delay of an edge in delay elements sensitive to variations of the at least one environmental parameter;
- and
- comparing a present delay with at least one reference value.
An integrated circuit, including:
- a network of delay elements individually connected to flip-flops, respective inputs of which define bits of a detection word linked to at least one environmental parameter of the integrated circuit;
- and
- means for comparing a present word with at least one binary reference word.
Dependencies are inferred from the claim text.