US 2003/0115517 A1 · Microprocessor-based probe for integrated circuit testing

Abstract

A test system is configured to include a programmable integrated circuit that is coupled between automatic test equipment (ATE) and a device-under-test (DUT). The programmable integrated circuit includes a microprocessor that is configured to accept relatively high-level test commands, typically in the form of a call to a pre-compiled subroutine or macro. Based on these high-level test commands, the microprocessor provides test stimuli to the device-under-test, collects test responses corresponding to these test stimuli, and provides raw or processed test responses to the ATE equipment for subsequent processing. Co-processors and other special purpose components are collocated with the microprocessor to further facilitate test-stimuli generation and test-response collection and processing via the programmable integrated circuit.

Claims18

Dependent claims

A test system comprising:

automated test equipment that includes:
a computer that is configured to execute a sequence of test operations for testing a device-under-test, and
an interface circuit, operably coupled to the computer, that is configured to transmit at least one test command of the sequence of test operations, and
a programmable integrated circuit, operably coupled to the automated test equipment and in immediate proximity to the device-under-test, that is configured to receive the test command, and to generate therefrom at least one test signal that is communicated to the device-under-test, based on a programmed set of instructions corresponding to the test command.

1 more element

Dependencies are inferred from the claim text.

Microprocessor-based probe for integrated circuit testing

Life of this patent

Microprocessor-based probe for integrated circuit testing

Life of this patent

Abstract

Claims18