Test fixture with adjustable pitch for network measurement

Abstract

A calibrated vector network analyzer (VNA) test system comprising two variable pitch test heads coupled to a VNA. A method for measuring the scattering parameters of at least one two port device under test (DUT) comprising: providing two variable pitch test heads, each test head comprising a signal arm and a ground arm and a cable electrically coupling the test head to a vector network analyzer (VNA); electrically coupling the signal arms of the test heads together; electrically coupling the ground arms of the test heads together; and utilizing the VNA to measure four scattering parameters of a network comprising the coupled test heads; electrically isolating the signal and ground arms of one of the two test heads from those of the other of the two test heads and using the VNA to obtain a reflect coefficient for each test head while the pitch of each test head is set to desired pitch of a port of the at least one DUT; placing each of the test heads in contact with a micro-strip circuit and utilizing the VNA to measure four scattering parameters of the network formed by placing the test heads in contact with the micro-strip circuit; utilizing the measured values to solve a set of 9 equations, the 9 equations containing 9 variables of which 1 is a propagation constant, and 8 are scattering parameters, utilizing the calibrated VNA to measure at least one scattering parameter of the at least one DUT. A method for measuring the scattering parameters of at least one two port DUT comprising: utilizing six reflection coefficients, four transmission coefficients, and a propagation constant to calibrate a VNA having two variable pitch test heads; utilizing the calibrated VNA to measure at least one scattering parameter of the at least one two port DUT.

Dependencies are inferred from the claim text.