Method for forming high dielectric layers using atomic layer deposition
AssigneeHynix Semiconductor Inc.
InventorsDeok-Sin Kil, Hyuk-Kyoo Jang
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AssigneeHynix Semiconductor Inc.
InventorsDeok-Sin Kil, Hyuk-Kyoo Jang
Estimating the term…
A method for manufacturing semiconductor device is disclosed which forms a high dielectric layer using atomic layer deposition (ALD). The method for forming a high dielectric layer having a first metal element, a titanium atom and an oxygen atom includes: a) preparing a substrate where a predetermined bottom layer is formed; b) on a surface of the substrate, adsorbing a first organism source combining a ligand, wherein the ligand includes at least oxygen and C—H combination in the first metal element; c) on the surface of the substrate, forming an atomic layer of the first metal element and the oxygen by inducing reduction reaction of the first organism source and a NH3 gas, which are adsorbed on the surface of the substrate; d) on the surface of the substrate where the atomic layer is formed, adsorbing a second organism source combining a ligand, wherein the ligand includes at least oxygen and C—H combination on the titanium; and e) on the surface of the substrate, forming an atomic layer of the titanium and the oxygen by inducing reduction reaction of the second organism source and the NH3 gas, which are adsorbed on the surface of the substrate.
A method for forming a high dielectric layer comprising a first metal element, a titanium element and an oxygen element, the method comprising:
A method for forming a high dielectric layer having a first metal element, a titanium element and an oxygen element, the method comprising:
A method for forming a high dielectric layer having a first metal element, a titanium element and an oxygen element, the method comprising the steps of:
The method of claim 24, further comprising the steps of:
Dependencies are inferred from the claim text.