Differential spr sensor and measuring method using it

Abstract

The present invention provides a differential SPR sensor that is capable of independently determining resonance wavelenghts without determining a baseline. A differential SPR sensor is formed with a surface immobilized with a recognition component and a surface not immobilized with the component on a metal film. The sensor comprises a plurality of dielectric films of different film thicknesses formed on the metal film, wherein one of said dielectric films is taken to be a reference surface and at least the other one dielectric film is taken to be a working surface immobilized with the recognition component. Preferably, the sensor is a probe-type SPR sensor, and a working surface and a reference surface are formed on a metal film providing a sensor surface of the probe.

Dependencies are inferred from the claim text.