Semiconductor storage device
AssigneeNEC Electronics Corporation
InventorsHiroyuki Takahashi, Masatoshi Sonoda
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AssigneeNEC Electronics Corporation
InventorsHiroyuki Takahashi, Masatoshi Sonoda
Estimating the term…
A semiconductor memory device is provided which does not malfunction even when noise, generated inside or outside a chip, superimposes on an address. Power source noise is generated internally when a sense amplifier is activated (times t7 and t13) and during data output operations (time t14); in addition, system noise from outside is generated at certain times. By internally capturing an address “Address”, which is input from the outside, at the rise (time t10) of a latch control signal LC, an input sensitivity control signal IC is made valid (times t6-t12) after an address skew period (times t1-t4), and sensitivity with respect to the address is reduced, canceling noise on the address. Furthermore, the latch control signal LC is lowered after a data output operation (time t17). Consequently, this cancellation of the latch state prevents the generation of an incorrect address transition detect signal ATD from the address appearing the noise.
(Amended) An input circuit which latches an input address signal at a predetermined timing, comprising:
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(Amended) An input circuit which supplies a first address signal to a predetermined circuit, which operates in response to the first address signal, comprising:
(New) An input circuit which latches an input address signal at a predetermined timing, comprising:
(New) An input circuit which latches an input address signal at a predetermined timing, comprising:
(New) An input circuit which latches an input address signal at a predetermined timing, comprising:
Dependencies are inferred from the claim text.