Method and device for reduction in noise in images from shiny parts
AssigneeGeneral Electric Company
InventorsKevin George Harding, Thomas Watkins Lloyd, Joseph Benjamin Ross
Life of this patent
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Abstract
A method for filtering undesired light reflections in a structured light measurement system during the inspection of shiny metal prismatic objects having uncoated prismatic surfaces, such as turbine blades, using polarized light.
Claims13
A method for reducing noise in a structured light measurement system having a structured light emitter projecting structured light onto a surface of an object, and an imaging system receiving structured light reflected from the surface of the object, comprising:
- polarizing said projected structured light at a known polarization angle;
- polarizing said reflected structured light at a said known polarization angle wherein projected structured light reflected indirectly from the surface of the object is filtered from said imaging system;
- and
- obtaining an image of said polarized reflected structured light with said imaging system.
A method for reducing noise in a structured light measurement system having a structured light emitter for projecting structured light onto the surface of an object having at least one prismatic feature, and an imaging system for receiving structured light reflected from a surface of the object, the structured light emitter and imaging system defining a plane, the method comprising:
- orienting the object in a field of view of said imaging system, such that said at least one prismatic feature is bisected by said plane;
- polarizing said projected structured light at a known polarization angle relative to said plane;
- polarizing said reflected structured light at said known polarization angle relative to said plane, wherein projected structured light reflected indirectly from the surface of said object is filtered from said imaging system;
- and
- obtaining an image of said polarized reflected structured light with said imaging system.
A method for reducing noise in a structured light measurement system having a structured light emitter for projecting structured light onto a surface of an object, and an imaging system for receiving structured light reflected from the surface of the object, comprising:
- orienting said object at a selected orientation to present a view of said surface to said imaging system;
- polarizing said projected structured light at a known polarization angle;
- polarizing said reflected structured light at said known polarization angle;
- obtaining an image of said polarized reflected structured light with said imaging system;
- and
- wherein said selected orientation and said known polarization angle cooperate to filter said projected structured light reflected indirectly from the surface of said object from said imaging system.
Dependencies are inferred from the claim text.