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US 2003/0112029 A1Published application
Built-in self repair for an integrated circuit
AssigneeMicron Technology, Inc.
InventorDavid A. Zimlich
Life of this patent
Estimating the term…
Abstract
An integrated circuit, such as a memory device, includes a built-in repair circuit. The repair circuit includes an on-chip source that produces a programming signal of sufficient duration and magnitude to program a programmable element that normally isolates a secondary circuit, such as redundant circuitry, from the remainder of the circuits on the device. Once programmed, the redundant circuitry may take the place of failed circuitry, and thus repair the device.
Claims69
An integrated circuit comprising:
- a programmable element located on the integrated circuit, the programmable element being coupled to a redundant circuit used to repair the integrated circuit;
- and
- a source located on the integrated circuit, the source adapted to be operatively coupled to the programmable element and to develop a programming signal sufficient to program the programmable element to activate the redundant circuit.
An integrated circuit comprising:
- a test circuit located on the integrated circuit, the test circuit operable to test a target circuit on the integrated circuit to determine whether the target circuit is to be altered;
- a programmable element located on the integrated circuit, the programmable element being coupled to a secondary circuit used to repair the target circuit;
- and
- a repair circuit comprising a source located on the integrated circuit, the source adapted develop and deliver a programming signal sufficient to program the 20 programmable element to activate the secondary circuit in response to the test circuit indicating that the target circuit is to be altered.
1 more element
A system comprising:
- a processor;
- a memory device operably coupled to the processor, the memory device comprising:
- a programmable element located on the memory device, the programmable element being coupled to a redundant row or column used to repair the memory device;
- and
- a source located on the memory device, the source adapted to develop and deliver a programming signal sufficient to program the programmable element to activate the redundant row or column in response to the processor indicating that a memory location of the memory device is non-functional.
2 more elements
An integrated circuit testing apparatus comprising:
- an integrated circuit;
- a testing device configured to couple to the integrated circuit and to functionally test at least one target circuit of the integrated circuit, wherein the integrated circuit comprises:
- a programmable element located on the integrated circuit, the programmable element being coupled to redundant circuitry used to repair the integrated circuit;
- and
- a source located on the integrated circuit, the source adapted to be operatively coupled to the programmable element and to develop a programming signal sufficient to program the programmable element to activate the redundant circuitry in response to the testing device indicating that the target circuit is at least partially non-functional.
2 more elements
Dependencies are inferred from the claim text.