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US 2003/0111591 A1Published application
CMOS radiation-measuring circuit with a variable threshold
AssigneeIntel Corporation
InventorsAli Keshavarzi, Jaume A. Segura, Vivek K. De
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Abstract
A radiation measuring technique includes adjusting a threshold level of a radiation sensor in a radiation-measuring circuit and obtaining an output signal based on radiation dose sensed by the radiation sensor.
Claims24
A method comprising:
- adjusting a threshold level of a radiation sensor in a radiation-measuring circuit;
- and
- obtaining an output signal based on radiation dose sensed by the radiation sensor.
An apparatus comprising:
- a radiation sensor with a threshold voltage;
- and
- an adjustable voltage source coupled to the radiation sensor to change the threshold level of the radiation sensor.
An apparatus comprising:
- a first transistor to sense radiation;
- a load transistor having a gate coupled to an output of the first transistor and having an output to provide a signal whose digital state depends on a state of the first transistor;
- and
- a current mirror coupled to the first transistor and the load transistor.
1 more element
Dependencies are inferred from the claim text.