Temperature measurement device
AssigneeHewlett-Packard Development Company, L.P.
InventorsMatthew D. Giere, Satya Prakash, Michael J. Barbour
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AssigneeHewlett-Packard Development Company, L.P.
InventorsMatthew D. Giere, Satya Prakash, Michael J. Barbour
Estimating the term…
An apparatus includes a substrate and a resistive element attached to a region of the substrate and formed of a first material having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces coupled to the resistive element, attached to the substrate, and formed of a second material having a second temperature coefficient of resistivity with the first material selected so that the first temperature coefficient of resistivity exceeds the second temperature coefficient of resistivity. An apparatus includes a substrate and a resistive element disposed onto a first region of the substrate and formed of a first material having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces coupled to the resistive element and each formed of a first plurality of sections of a second material having a second temperature coefficient of resistivity and a second plurality of sections of a third material having a third temperature coefficient of resistivity.
An apparatus, comprising:
An apparatus, comprising:
A temperature measurement system for use in a printhead having a substrate, comprising
A method of measuring temperature of a substrate in a printhead, comprising:
An imaging device, comprising
An inkjet printer, comprising
A temperature measurement system, comprising:
Dependencies are inferred from the claim text.