Electronic device

An electronic device (100), comprising:

• a plurality of subdevices (120a, 120b);
• a bypass multiplexer (102) having a first input (103), a second input (104) and an output (106);
• a test data input (110);
• a test data output (112) coupled to the output (106) of the bypass multiplexer (102);
• a plurality of test interfaces (140a, 140b, 160), comprising:
• a set of test interfaces (140a, 140b), each test interface (140a;
• 140b) in the set of test interfaces (140a, 140b) being coupled to a subdevice (120a;
• 120b) from the plurality of subdevices (120a, 120b), the set of test interfaces (140a, 140b) forming a chain of test interfaces (140) in that a test data out contact (142a) of a predecessor test interface (140a) in the chain of test interfaces (140) is coupled to a test data in contact (141b) of a successor test interface (140b) in the chain (140);
• and
• a boundary scan compliant further test interface (160) for controlling the bypass multiplexer (102), the further test interface (160) having:
• a further test data in contact (161) coupled to the test data input (110);
• and
• a further test data out contact (162) coupled to the first input (103) of the bypass multiplexer (102);
• characterized in that:
• a test data out contact (142b) of a last test interface (140b) in the chain of test interfaces (140) is coupled to the second input (104) of the bypass multiplexer (102);
• and
• the further test data out contact (162) is further coupled to a test data in contact (141a) of a first test interface (140a) in the chain of test interfaces (140).