Boron-containing polishing system and method
AssigneeCabot Microelectroncs Corporation
InventorsRenjie Zhou, Steven K. Grumbine, Isaac K. Cherian
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Abstract
The invention provides a chemical-mechanical polishing system comprising an abrasive, a carrier, and either boric acid, or a conjugate base thereof, wherein the boric acid and conjugate base are not present together in the polishing system in a sufficient amount to act as a pH buffer, or a water-soluble boron-containing compound, or salt thereof, that is not boric acid, and a method of polishing a substrate using the chemical-mechanical polishing system.
Claims44
A chemical-mechanical polishing system comprising:
- (a) an abrasive and/or polishing pad,
- (b) boric acid, or a conjugate base thereof, and
- (c) an aqueous carrier,
- wherein the boric acid and conjugate base are not present together in the polishing system in a sufficient amount to act as a pH buffer.
A chemical-mechanical polishing system comprising:
- (a) an abrasive and/or polishing pad,
- (b) an aqueous carrier, and
- (c) a water-soluble boron-containing compound that is not boric acid, or salt thereof, formula I-VII:
- 2
- wherein,
- R1, R2, R3, R5, R6, R9, R14, R18, R19, R22, R23, and R24 are independently selected from the group consisting of H, C1-20 alkyl, C6-30 aryl including polycyclic aryl, cyclo(C3-20)alkyl, hetero(C6-30)aryl including polycyclic heteroaryl, C3-20 heterocyclyl, C2-20 alkenyl, and C2-20 alkynyl,
- R4, R7, R8, R10 R11, R12, R13, R15, R16, R17, R20, R21, and R25are independently selected from the group consisting of H, halide, C1-20 alkyl, C6-30 aryl including polycyclic aryl, cyclo(C3-20)alkyl, hetero(C6-30)aryl including polycyclic heteroaryl, C3-20 heterocyclyl, C2-20 alkenyl, and C2-20 alkynyl,
- any two R substituents of a formula can be linked through 1-16 atoms selected from the group consisting of C, N, O, and S to form a cyclic ring, and
- R1-R25 are optionally substituted with 1-5 substituents independently selected from the group consisting of halide, C1-20 alkyl, C1-20 alkoxy, thio(C1-20)alkyl, C6-30 aryl including polycyclic aryl, C6-30 ar(C1-20)alkyl, C6-30 ar(C1-20)alkoxy, thio(C6-30)aryl, cyclo(C1-20)alkyl, cyclo(C3-20)alkyloxy, hetero(C6-30)aryl including polycyclic heteroaryl, C3-20 heterocyclyl, heterocyclo(C3-20)alkyloxy, C2-20 alkenyl, C2-20 alkynyl, B(OH)(C1-20 alkyl), B(OH)(cyclo(C1-20)alkyl), B(OH)(C6-30 aryl), B(OH)(C6-30 heteroaryl), B(OH)2, thiol, hydroxy, halo(C1-20)alkyl, halo(C1-20)alkoxy, nitro, amino, C1-20 alkylamino, di(C1-20)alkylamino, amino(C1-20)alkyl, C1-20alkylamino(C1-20)alkyl, nitrile, cyano, carbonyl, C1-20 alkylcarbonyl, carboxy, carboxy(C1-20)alkyl, silyl, and siloxy.
A method of polishing a substrate comprising:
- (i) contacting a substrate with a chemical-mechanical polishing system comprising:
- (a) an abrasive and/or polishing pad,
- (b) boric acid, or conjugate base thereof, and
- (c) an aqueous carrier,
- wherein the boric acid and conjugate base are not present together in the polishing system in a sufficient amount to act as a pH buffer, and
- (ii) abrading at least a portion of the substrate to polish the substrate.
A method of polishing a substrate comprising:
- (i) contacting a substrate with a chemical-mechanical polishing system comprising:
- (a) an abrasive and/or polishing pad,
- (b) an aqueous carrier, and
- (c) a water-soluble boron-containing compound that is not boric acid, or salt thereof, of formula I-VII:
- 3
- wherein,
- R1, R2, R3, R5, R6, R9, R14, R18, R19, R22, R23, and R24 are independently selected from the group consisting of H, C1-20 alkyl, C6-30 aryl including polycyclic aryl, cyclo(C3-20)alkyl, hetero(C6-30)aryl including polycyclic heteroaryl, C3-20 heterocyclyl, C2-20 alkenyl, and C2-20 alkynyl,
- R4, R7, R8, R10, R11, R12, R13, R15, R16, R17, R20, R21, and R25are independently selected from the group consisting of H, halide, C1-20 alkyl, C6-30 aryl including polycyclic aryl, cyclo(C3-20)alkyl, hetero(C6-30)aryl including polycyclic heteroaryl, C3-20 heterocyclyl, C2-20 alkenyl, and C2-20 alkynyl,
- any two R substituents of a formula can be linked through 1-16 atoms selected from the group consisting of C, N, O, and S to form a cyclic ring, and
- R1- R25 are optionally substituted with 1-5 substituents independently selected from the group consisting of halide, C1-20 alkyl, C1-20 alkoxy, thio(C1-20)alkyl, C6-30 aryl including polycyclic aryl, C6-30 ar(C1-20)alkyl, C6-30 ar(C1-20)alkoxy, thio(C6-30)aryl, cyclo(C1-20)alkyl, cyclo(C3-20)alkyloxy, hetero(C6-30)aryl including polycyclic heteroaryl, C3-20 heterocyclyl, heterocyclo(C3-20)alkyloxy, C2-20 alkenyl, C2-20 alkynyl, B(OH)(C1-20 alkyl), B(OH)(cyclo(C1-20)alkyl), B(OH)(C6-30 aryl), B(OH)(C6-30 heteroaryl), B(OH)2, thiol, hydroxy, halo(C1-20)alkyl, halo(C1-20)alkoxy, nitro, amino, C1-20 alkylamino, di(C1-20)alkylamino, amino(C1-20)alkyl, C1-20alkylamino(C1-20)alkyl, nitrile, cyano, carbonyl, C1-20 alkylcarbonyl, carboxy, carboxy(C1-20)alkyl, silyl, and siloxy, and
- (ii) abrading at least a portion of the substrate to polish the substrate.
Dependencies are inferred from the claim text.