Fault detection system
AssigneeHitachi, Ltd.
InventorsYutaka Sato, Masahiro Nagasu, Katsumi Ishikawa, Ryuichi Saito, Satoru Inarida
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Abstract
A fault detection system detecting malfunctions or deteriorations, which may result in an inverter fault, is provided. The system has a temperature sensor installed on a semiconductor module to monitor a temperature rise rate. It is judged that an abnormal condition had occurred if the thermal resistance is increased by the deterioration of a soldering layer of the semiconductor module or by drive circuit malfunctions and, as a result, the relation between an operation mode and the temperature rise rate falls outside a predetermined range.
Claims7
A fault detection system comprising:
- a semiconductor module;
- a temperature sense device installed on said semiconductor module;
- temperature measuring means for measuring a temperature from said temperature sense device;
- and
- fault detecting means coupled to said temperature measuring means for detecting a deterioration or a fault of said semiconductor module, based on the temperature measured by said temperature measuring means and an operation command issued to the semiconductor module.
A fault detection system comprising:
- a semiconductor module;
- a temperature sense element built in said semiconductor module;
- temperature measuring means for determining a temperature from said temperature sense element;
- temperature rise rate detecting means for calculating a temperature rise rate from the temperature measured by said temperature measuring means;
- loss calculating means for calculating a loss caused in the semiconductor module;
- and
- fault detecting means coupled to said detecting means and said loss calculating means for detecting a degradation or a fault of said semiconductor module, based on the calculated temperature rise rate and the calculated loss.
A fault detection system comprising:
- a semiconductor module;
- a temperature sense device installed on said semiconductor module;
- temperature measuring means for reading a temperature from said temperature sense device;
- loss calculating means for calculating a loss generated in the semiconductor module;
- temperature estimating means for estimating a temperature of the semiconductor module from the loss;
- and
- fault detecting means for detecting a deterioration or a fault of said semiconductor modules based on the estimated temperature and the measured temperature.
Dependencies are inferred from the claim text.