Method of titanium and titanium nitride layer deposition
AssigneeApplied Materials, Inc.
InventorsTong Zhang, Hyoung-Chan Ha, Jeong Soo Byun, Avgerinos Gelatos, Frederick C. Wu
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AssigneeApplied Materials, Inc.
InventorsTong Zhang, Hyoung-Chan Ha, Jeong Soo Byun, Avgerinos Gelatos, Frederick C. Wu
Estimating the term…
A method of forming a film structure (e.g., film stacks) comprising titanium (Ti) and/or titanium nitride (TiN). The Ti film structure is formed by alternately depositing and then plasma treating thin films (less than about 100 Å thick) of titanium. The TiN film structure is formed by alternately depositing and then plasma treating thin films (less than about 300 Å thick) of titanium nitride. The titanium films are formed using a plasma reaction of titanium tetrachloride (TiCl4) and a hydrogen-containing gas. The titanium nitride films are formed by thermally reacting titanium tetrachloride with a nitrogen-containing gas. The subsequent plasma treatment steps comprise a nitrogen/hydrogen-containing plasma.
A method of film deposition, comprising:
A method of film deposition, comprising:
A method of forming a barrier layer structure, comprising:
A method of forming an electrode on a capacitive device, comprising:
Dependencies are inferred from the claim text.