Digitally controllable internal clock generating circuit of semiconductor memory device and method for same
AssigneeSamsung Electronics Co., Ltd.
InventorsNam-Seog Kim, Yong-Jin Yoon
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Abstract
An internal clock generating circuit of a semiconductor device includes: a delay chain having a plurality of delay units for generating multi-phase clocks by adjusting an input clock; a thermometer for outputting a thermometer code value in response to an input selection data; a multiplexer for selectively outputting one of a plurality of clocks input from the delay chain in response to the thermometer code value of the thermometer; and a pulse regenerator for outputting an adjusted internal clock by restoring a pulse form of the clock output from the multiplexer into its original state and controlling the delay thereof as much as desired.
Claims12
An internal clock generating circuit of a semiconductor device comprising:
- a delay chain having a plurality of delay units for generating multi-phase clocks by adjusting an input clock;
- a thermometer converter for outputting a thermometer code value in response to an input selection data;
- and
- a multiplexer for selectively outputting one of a plurality of clocks input from the delay chain in response to the thermometer code value.
A method of generating clock signals in a semiconductor device comprising the steps of:
- generating multi-phase clock signals by adjusting an input clock signal through a delay chain having a plurality of delay units;
- decoding a thermometer code value in accordance with selection data;
- outputting one of the plurality of clock signals in response to the thermometer code value;
- and
- restoring a pulse shape of the output clock signal into its original state and outputting it as a delay-controlled internal clock signal.
A semiconductor clock signal circuit, comprising:
- means for generating multi-phase clock signals by adjusting an input clock signal through a delay chain having a plurality of delay units;
- means for decoding a thermometer code value in accordance with selection data;
- means for outputting one of the plurality of clock signals in response to the thermometer code value;
- and
- means for restoring a pulse shape of the output clock signal into its original state and outputting it as a delay-controlled internal clock signal.
Dependencies are inferred from the claim text.