Time data compression technique for high speed integrated circuit memory devices
AssigneeProMOS Technologies Inc.
InventorsMichael C. Parris, Oscar Frederick Jones JR.
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AssigneeProMOS Technologies Inc.
InventorsMichael C. Parris, Oscar Frederick Jones JR.
Estimating the term…
A time data compression technique which allows high speed integrated circuit (“IC”) memory devices to be tested at full speed with test equipment which is capable of operating at only at relatively slower speeds than that of the memory devices without increasing test time or decreasing production throughput. Through the use of the technique disclosed herein, data is initially sorted in time and them compared for a predetermined number of logic level “1s” or “0s” to be effectively compressed in time. This time compression allows high rate data streams to be tested at effectively slower rates. The technique of the present invention can be utilized to effectively reduce the data rate by one half, one quarter or to any sub-multiple of the normal memory frequency without increasing time in test. In a particular embodiment, the present invention may be functional to convert double data rate (“DDR”) data to single data rate (“SDR”) to allow DDR memory devices to be more easily and effectively tested.
A time data compression circuit comprising:
A time data compression circuit comprising:
A method for time data compression comprising:
A method for time data compression comprising:
Dependencies are inferred from the claim text.