Substrate for semiconductor device and method of manufacturing the same
AssigneeRohm Co., Ltd.
InventorsTomonobu Hata, Kimihiro Sasaki, Akira Kamisawa
Life of this patent
Estimating the term…
Loading patent…
AssigneeRohm Co., Ltd.
InventorsTomonobu Hata, Kimihiro Sasaki, Akira Kamisawa
Estimating the term…
Metal which forms a crystalline insulation layer is sputtered at a target and deposited as a film on a silicon substrate, the metal is chemically combined with reactive gas around the silicon substrate to thereby grow a crystal layer of a crystalline insulation substance, and a voltage is applied to the substrate so that ions of the reactive gas around the substrate are attracted to a surface of the silicon substrate and chemically combined with silicon, whereby an insulation silicon compound layer is formed. As a result, a structure is obtained in which a crystalline insulation layer is formed on a crystalline silicon layer through an amorphous insulation film which is formed by a silicon compound which has an excellent insulation characteristic. Hence, it is possible to epitaxially grow other semiconductor layer or a crystalline ferroelectric layer on a surface of the crystalline insulation layer, which makes it possible to form a three dimensional semiconductor device, a composite semiconductor device, a high performance semiconductor memory device or the like. Thus, it is possible to obtain a semiconductor device which is new and highly integrated at an inexpensive cost.
A method of manufacturing a semiconductor substrate for a semiconductor device comprising the steps of:
A method of manufacturing a semiconductor device, comprising the step of:
Dependencies are inferred from the claim text.