US 2002/0176627 A1 · Pattern-collating device, pattern-collating method and pattern-collating program

Abstract

The pattern-collating device includes as feature point pairs, among feature points which are portions indicating respective features of an examination target graphic which is the graphic to be compared and a model graphic which is the reference graphic, those which mutually correspond in said examination target graphic and said model graphic and a similarity determination section which calculates the similarity between the examination target graphic and the model graphic based on correspondence of the feature points by the feature point pair formation section, wherein the similarity determination section calculates the similarity between the examination target graphic and the model graphic based on a probability that the number of the feature point pairs between an arbitrary graphic and the model graphic, is not less than the number of the feature point pairs between the examination target graphic and the model graphic previously obtained by the feature point pair formation section.

Claims18

Dependent claims

A pattern collating device for collating an examination target graphic with a model graphic, comprising:

feature point pair formation means for making feature point pairs, each of which is composed of a feature point in said examination target graphic and a feature point in said model graphic which correspond to each other, said feature point in said examination target graphic which composes each of said feature point pair being selected from points which indicate feature of said examination target graphic, said feature point in said model graphic which composes each of said feature point pair being selected from points which indicate feature of said model graphic:
probability calculation means for calculating a probability that a number of feature point pairs between an arbitrary graphic and said model graphic is not less than a number of said feature point pairs between said examination target graphic and said model graphic,
similarity calculation means for calculating similarity between said examination target graphic and said model graphic on the basis of said probability.

A pattern collating method for collating an examination target graphic with a model graphic, comprising:

a feature point pair formation step for making feature point pairs, each of which is composed of a feature point in said examination target graphic and a feature point in said model graphic which correspond to each other, said feature point in said examination target graphic which composes each of said feature point pair being selected from points which indicate feature of said examination target graphic, said feature point in said model graphic which composes each of said feature point pair being selected from points which indicate feature of said model graphic:
a probability calculation step for calculating a probability that a number of feature point pairs between an arbitrary graphic and said model graphic is not less than a number of said feature point pairs between said examination target graphic and said model graphic,
a similarity calculation step for calculating similarity between said examination target graphic and said model graphic on the basis of said probability.

A record medium on which a computer program is recorded, said computer program comprising instructions for having a computer executing a pattern collating method for collating an examination target graphic with a model graphic, comprising:

a feature point pair formation step for making feature point pairs, each of which is composed of a feature point in said examination target graphic and a feature point in said model graphic which correspond to each other, said feature point in said examination target graphic which composes each of said feature point pair being selected from points which indicate feature of said examination target graphic, said feature point in said model graphic which composes each of said feature point pair being selected from points which indicate feature of said model graphic:
a probability calculation step for calculating a probability that a number of feature point pairs between an arbitrary graphic and said model graphic is not less than a number of said feature point pairs between said examination target graphic and said model graphic,
a similarity calculation step for calculating similarity between said examination target graphic and said model graphic on the basis of said probability.

Dependencies are inferred from the claim text.

Pattern-collating device, pattern-collating method and pattern-collating program

Life of this patent

Pattern-collating device, pattern-collating method and pattern-collating program

Life of this patent

Abstract

Claims18