Arrangement for spectrally sensitive reflected-light and transmitted-light microscopy
AssigneeLeica Microsystems CMS GmbH
InventorRolf Borlinghaus
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Abstract
The arrangement for spectrally sensitive reflected-light and transmitted-light microscopy comprises an illuminating device which illuminates a sample under study in two dimensions. A scanning device is provided which respectively directs the light emanating from a detection region of the sample under study onto a multiband detector. In one embodiment, the illuminating device is arranged in such a way that it transilluminates the sample in two dimensions. In a further embodiment, the illuminating device illuminates the sample in two dimensions in reflected light.
Claims8
Arrangement for spectrally sensitive reflected-light and transmitted-light spectroscopy, comprising a broadband illuminating device (1) for illuminating at least one region of a sample (4) in two dimensions, a scanning device (6) which defines a detection region in the sample and a multiband detector (7) which receives the light emanating from the detection region of the sample in temporal sequence wherein the light emanating from said illuminated region of said sample is directed by the scanning device (6) in temporal sequence to said detection device, so that at least a portion of said light emanating from said illuminated region of said sample reaches said detection device in temporal sequence.
Dependencies are inferred from the claim text.