On-line method for detecting particle size during a milling process
AssigneeEastman Kodak Company
InventorsSteven C. Switalski, Donald J. Majka
Life of this patent
Estimating the term…
Abstract
An on-line method for detecting particle size of a liquid during a process in which there is not a correlation between low absorbance with small particle size, the method comprises the steps of measuring a plurality of reference particle sizes each associated with a particular near infrared diffuse reflectance spectrum for creating a reference infrared diffuse reflectance spectrum having high absorbance with small particle size; measuring on-line a near infrared diffuse reflectance spectrum of the liquid during the process; and determining the particle size of the on-line liquid based on correlating the on-line-measured particle size with the reference near infrared diffuse reflectance spectrum.
Claims10
A on-line method for detecting size of particles in a liquid during a process, the method comprising the steps of:
- (a) measuring a plurality of reference particle sizes each associated with a particular near infrared diffuse reflectance spectrum for creating a reference near infrared diffuse reflectance spectrum;
- (b) measuring on-line a near infrared diffuse reflectance spectrum of the liquid during the process;
- and
- (c) determining the size of the particles in the on-line liquid based on correlating the on-line-measured particle size with the reference near infrared diffuse reflectance spectrum.
A method for detecting size of particles in a liquid, the method comprising the steps of
- (a) measuring a plurality of reference particle sizes each associated with a particular near infrared diffuse reflectance spectrum for creating a reference infrared diffuse reflectance spectrum;
- (b) measuring a near infrared diffuse reflectance spectrum of the liquid;
- and
- (c) determining the size of the particles in the liquid based on correlating the measured particle size with the reference near infrared diffuse reflectance spectrum.
Dependencies are inferred from the claim text.