A device for inspecting a circuit or a circuit element provided on an element substrate, the device comprising:
- a first primary coil;
- a second secondary coil;
- means for overlapping the first primary coil and a first secondary coil provided on an element substrate with a certain spacing set between the first primary coil and the first secondary coil;
- means for overlapping the second secondary coil and a second primary coil provided on the element substrate with a certain spacing set between the second secondary coil and the second primary coil;
- means for applying an ac voltage between a pair of terminals of the first primary coil;
- and
- means for inspecting an operating condition of the circuit or the circuit element through an ac voltage generated between a pair of terminals of the second secondary coil.