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US 2002/0172620 A1Published application
Systems and methods for rapid evaluation of chemical resistance of materials
OwnerRadislav Alexandrovich Potyrailoinventor
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Abstract
RD-2ems and methods are disclosed for evaluation of small amounts of materials of interest for their resistance to exposure to environmental parameters such as chemicals. The invention also enables analysis of multiple samples simultaneously. Embodiments of the invention include the use of acoustic-wave devices for evaluation of chemical resistance of materials to a chemical, where the materials are deposited on the acoustic-wave devices or are resident in a volume of the chemical used for the material evaluation.
Claims49
A high throughput screening system for evaluating chemical resistance, comprising:
- at least one chemical selected from a plurality of chemicals;
- a plurality of materials exposable to the chemical;
- a plurality of acoustic-wave devices each associated with a corresponding one of the plurality of materials and each having a first acoustic-wave property and a second acoustic-wave property, wherein for each of the plurality of acoustic-wave devices the first acoustic-wave property corresponds to an acoustic-wave property prior to exposure to the corresponding one of the plurality of materials to the chemical and the second acoustic-wave property corresponds to an acoustic-wave property subsequent to exposure to the corresponding one of the plurality of materials to the chemical;
- an acoustic-wave property detector for measuring the first acoustic-wave property and the second acoustic-wave property of each of the plurality of acoustic-wave devices;
- and
- an analyzer for determining an acoustic-wave property change between the first acoustic-wave property and the second acoustic-wave property for each of the plurality of materials, wherein for each of the plurality of materials the acoustic-wave property change is correlated to a chemical resistance to the chemical.
3 more elements
A system for measuring a variation in each of a plurality of minute samples of materials of interest, the system comprising:
- a plurality of acoustic-wave devices, wherein one from the plurality of samples is deposited on each of the plurality of acoustic-wave devices;
- at least one oscillation source coupled to each of the plurality of acoustic-wave devices, such that each of the plurality of acoustic-wave devices has an applied oscillation potential, the applied oscillation potential producing in each of the plurality of acoustic-wave devices an acoustic-wave property, wherein the acoustic-wave property for each of the plurality of acoustic-wave devices varies with a variation in the associated deposited sample;
- a plurality of acoustic-wave property detectors, each of the plurality of acoustic-wave property detectors associated with at least one from the plurality of acoustic-wave devices;
- and
- at least one processor coupled to the plurality of acoustic-wave property detectors, wherein the at least one processor is capable of calculating the variation in each of the plurality of applied samples as a function of the variation of the associated acoustic-wave property.
2 more elements
A system for measuring a change in mass over time for a plurality of minute samples of materials of interest, wherein each of the plurality of samples has an associated mass, the system comprising:
- a plurality of acoustic-wave devices, wherein one from the plurality of samples is associated with a corresponding one of the plurality of acoustic-wave devices;
- a plurality of oscillation sources, at least one oscillation source coupled to each of the plurality of acoustic-wave devices such that each of the plurality of acoustic-wave devices has an applied oscillation potential, the applied oscillation potential producing in each of the plurality of acoustic-wave devices an oscillation frequency,
- wherein the oscillation frequency for each of the plurality of acoustic-wave devices varies with variation in the mass of the associated applied sample;
- at least one acoustic-wave property detector associated with each of the plurality of acoustic-wave devices, each acoustic wave property detector operable to measure the variation in oscillation frequency associated with each acoustic-wave device;
- and
- at least one processor coupled to the at least one acoustic-wave property detector, wherein the at least one processor is capable of calculating the change in mass of each of the plurality of applied samples as a function of the variation of the associated oscillation frequency.
3 more elements
A high throughput method of evaluating chemical resistance, comprising:
- measuring a first acoustic-wave property of each one of a plurality of acoustic-wave devices associated with each of a plurality of materials, where the first acoustic-wave property corresponds to a property prior to exposure of each of the plurality of materials to a corresponding one of a plurality of chemicals;
- exposing each of the plurality of materials to the corresponding one of the plurality of chemicals;
- measuring a second acoustic-wave property of each one of the plurality of acoustic-wave devices associated with each of the plurality of materials, where the second acoustic-wave property corresponds to a property subsequent to exposure to the corresponding one of the plurality of chemicals;
- and
- analyzing an acoustic-wave property change between the first acoustic-wave property and the second acoustic-wave property for each of the plurality of acoustic-wave devices associated with each of the plurality of materials, where the acoustic-wave property change is correlated to a chemical resistance to the corresponding chemical for each of the plurality of materials.
2 more elements
A method for measuring variation in a plurality of minute samples of materials of interest, the method comprising:
- applying an oscillating potential to each of a plurality of acoustic-wave devices prior to a variation in each of the plurality of samples such that each of the plurality of acoustic-wave devices has a first acoustic-wave device oscillation frequency;
- applying the oscillating potential to each of the plurality of acoustic-wave devices subsequent to the variation in at least one of the plurality of samples such that each of the plurality of acoustic-wave devices has a second acoustic-wave device oscillation frequency;
- determining a difference between the first acoustic-wave device oscillation frequency and the second acoustic-wave device oscillation frequency for each of the plurality of acoustic-wave devices;
- and
- calculating the variation in each of the plurality of applied samples based on the determined difference between the first acoustic-wave device oscillation frequency and the second acoustic-wave device oscillation frequency for each of the plurality of acoustic-wave devices.
2 more elements
A method for measuring mass over time for a plurality of minute samples of materials of interest, wherein each of the plurality of minute samples has an associated mass, the method comprising:
- applying an oscillating potential to each of a plurality of acoustic-wave devices prior to a mass variation in each of the plurality of samples such that each of the plurality of acoustic-wave devices has a first acoustic-wave device oscillation frequency;
- applying the oscillating potential to each of the plurality of acoustic-wave devices subsequent to a mass variation in at least one of the plurality of samples such that each of the plurality of acoustic-wave devices has a second acoustic-wave device oscillation frequency;
- determining a difference between the first acoustic-wave device oscillation frequency and the second acoustic-wave device oscillation frequency for each of the plurality of acoustic-wave devices;
- and
- calculating the variation of mass in each of the plurality of applied samples based on the determined difference between the first acoustic-wave device oscillation frequency and the second acoustic-wave device oscillation frequency for each of the plurality of acoustic-wave devices.
2 more elements
Dependencies are inferred from the claim text.