Method and apparatus for self-testing and maintaining alignment of an optical beam in an optical switch
AssigneeIntel Corporation
InventorsMario J. Paniccia, Dean A. Samara-Rubio
Life of this patent
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Abstract
An optical processing element such as an optical switch for which continuous or periodic self-testing and/or alignment is provided. In one embodiment, an optical sensor is disposed in a semiconductor substrate layer within a region surrounding an optical path of an optical output port of the optical processing element. In one embodiment, an optical fiber optically coupled to the optical output port is disposed in a V-groove in which the optical sensor is disposed. In one embodiment, circuitry is coupled to the optical sensor to adjust continuously or periodically over time the alignment of an optical beam directed to the optical output port.
Claims30
An apparatus, comprising:
- an optical switching device disposed in a semiconductor substrate layer;
- first and second optical ports disposed in the semiconductor substrate layer, the first and second optical ports optically coupled to the optical switching device;
- and
- an optical sensor disposed within a region surrounding an optical path of the second optical port, the optical sensor coupled to detect an alignment of an optical coupling between the optical switching device and the second optical port.
A method, comprising:
- directing an optical beam through a first optical port into a semiconductor substrate layer;
- directing the optical beam along the semiconductor substrate layer through an optical switching device disposed in the semiconductor substrate layer;
- directing the optical beam to a second optical port in response to a signal coupled to be received by the optical switching device;
- detecting an alignment of an optical coupling between the optical switching device and the second optical port.
An apparatus, comprising:
- means for receiving an optical beam in a semiconductor substrate layer;
- means for selectively directing the optical beam from the semiconductor substrate layer in response to a signal to a means for transmitting the optical beam from the semiconductor substrate layer;
- and
- means for detecting an alignment of an optical coupling between the means for selectively directing the optical beam and the means for transmitting the optical beam.
An apparatus, comprising:
- a semiconductor substrate;
- a plurality of grooves formed in and spaced apart in the semiconductor substrate;
- a plurality of optical fibers, each one of the plurality of grooves having one of the plurality of optical fibers disposed therein;
- and
- a plurality of optical sensors, each one of the plurality of grooves including at least one of the plurality of optical sensors, each one of the plurality of optical sensors having an output coupled to be received by circuitry to maintain alignment of optical beams optically coupled to be received by each respective one of the plurality of optical fibers.
Dependencies are inferred from the claim text.