Device for and method of testing semiconductor laser module
AssigneeFujitsu Quantum Devices Limited
InventorsHaruyoshi Ono, Isao Baba
Life of this patent
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Abstract
In the semiconductor laser module testing device, a temperature control power source changes a temperature of a wavelength locker module, and a wavelength monitoring bias circuit detects an output of a wavelength monitor in the changed temperature range and computes a correlation between a temperature of a semiconductor laser and a wavelength of light output therefrom. Moreover, the wavelength of the output light is locked by controlling the temperature of the wavelength locker module while feeding back the output of the wavelength monitor by a wavelength feedback circuit based on the obtained correlation between the temperature and the wavelength.
Claims12
A semiconductor laser module testing device, the semiconductor laser module provided with a semiconductor laser, a wavelength monitor for detecting a wavelength of light output from the semiconductor laser, and a temperature control device for controlling a temperature of the semiconductor laser, the semiconductor laser module testing device comprising:
- a wavelength feedback circuit which compares a wavelength detected by the wavelength monitor of the semiconductor laser module with a target wavelength, and outputs a comparison signal corresponding to a result of the comparison;
- a processor which outputs a control signal corresponding to the comparison signal supplied from the wavelength feedback circuit;
- and
- a temperature control power source which controls power to be supplied to the temperature control device based on the control signal supplied from the processor.
A semiconductor laser module testing device, the semiconductor laser module provided with a semiconductor laser, a wavelength monitor for detecting a wavelength of light output from the semiconductor laser, a temperature control device for controlling a temperature of the semiconductor laser, and a temperature monitor for detecting a temperature of the semiconductor laser, the semiconductor laser module testing device comprising:
- a wavelength feedback circuit which compares a wavelength detected by the wavelength monitor of the semiconductor laser module with a target wavelength, and outputs a comparison signal corresponding to a result of the comparison;
- a temperature feedback circuit which compares the temperature detected by the temperature monitor with a set temperature, and outputs a comparison signal corresponding to a result of the comparison;
- a processor which outputs a control signal corresponding to the comparison signal supplied from the wavelength feedback circuit or the temperature feedback circuit;
- and
- a temperature control power source which controls power to be supplied to the temperature control device based on the control signal supplied from the processor.
A method of testing a semiconductor laser module, the semiconductor laser module provided with a semiconductor laser, a wavelength monitor for detecting a wavelength of light output from the semiconductor laser, and a temperature control device for controlling a temperature of the semiconductor laser, the method of testing the semiconductor laser module comprising:
- a step of obtaining a correlation between a temperature of the semiconductor laser and a wavelength of the light output therefrom based on a change amount of the temperature when the temperature of the semiconductor laser is changed by controlling power to be supplied to the temperature control device, and on a change amount of the wavelength detected by the wavelength monitor.
A method of testing a semiconductor laser module, the semiconductor laser module provided with a semiconductor laser, a wavelength monitor for detecting a wavelength of light output from the semiconductor laser, a temperature control device for controlling a temperature of the semiconductor laser, and a temperature monitor for detecting a temperature of the semiconductor laser, the method of testing the semiconductor laser module comprising:
- a step of obtaining a correlation between a temperature of the semiconductor laser and a wavelength of the light output therefrom based on a change amount of the temperature when the temperature of the semiconductor laser is changed by controlling power to be supplied to the temperature control device while detecting the temperature of the semiconductor laser by the temperature monitor, and on a change amount of the wavelength detected by the wavelength monitor.
Dependencies are inferred from the claim text.