Instrument for rapidly characterizing material reflectance properties

Abstract

A reflectometer characterizes the reflectance properties of a test material. The reflectometer includes a radiation subsystem that generates and directs radiation onto a test material at a plurality of incident angles. An elliptical reflector assembly has one or more reflectors with a first and second foci. A holder positions the test material at the first focus of the reflectors. One or more lenses are located within a first focal length of the second focus of the reflectors. The lenses receive a first angular image that is reflected by the reflector. The holder is rotatable relative to the radiation subsystem. Stepper motors and encoders vary the angular position of the incident angle and an azimuth angle of the test material. A computer records an angular image for each azimuth and incident angle to completely characterize the reflectance properties of the test material.

Dependencies are inferred from the claim text.