High-frequency test probe assembly for microcircuits and associated methods

A test and ground probe assembly comprising:

• a test probe comprising a unitary elongated electrically conductive arm member movably affixable to a retaining block and having:
• a pair of generally planar and parallel side surfaces extending along a longitudinal axis;
• a rear end portion for connecting to a test circuit;
• a front end portion for contacting a circuit to be tested comprising an upwardly extending tip;
• and
• a rear- and a front-central portion, the rear central portion adjacent the rear end portion, the front central portion between the rear central portion and the front end portion, the front central portion having a hole extending through the arm between the side surfaces;
• and
• a pair of ground probes, each comprising a unitary elongated electrically conductive arm member, each movably affixable to a retaining block and having:
• a pair of generally planar and parallel side surfaces extending along a longitudinal axis;
• a rear end portion for connecting to ground;
• a front end portion for contacting a circuit to be tested comprising an upwardly extending tip;
• a rear- and a front-central portion, the rear central portion adjacent the rear end portion, the front central portion between the rear central portion and the front end portion, the front central portion having a hole extending through the arm between the side surfaces;
• wherein the test probe is positioned between the ground probes, all side surfaces thereof generally parallel to each other and the tips approximately coplanar.

A test probe assembly comprising:

• an electrically insulating retaining block having a slot in a top surface thereof, the slot having a width, a depth, and a length;
• and
• a test probe partially positioned within the block slot, comprising a unitary elongated electrically conductive arm member and having:
• a pair of generally planar and parallel side surfaces extending along a longitudinal axis, a width between the side surfaces smaller than the block slot width;
• a rear end portion for connecting to a test circuit;
• a front end portion for contacting a circuit to be tested comprising an upwardly extending tip and having a height greater than the block slot depth;
• a rear- and a front-central portion, the rear-central portion adjacent the rear end portion, the front central portion between the rear central portion and the front end portion, the front central portion having a slot extending between the side surfaces;
• and
• a length from a front edge to a section where the rear- and front-central portions meet smaller than the block slot length.

A method of making a test probe comprising the steps of:

• providing a generally flat sheet of insulating material;
• cutting a test probe interior from the sheet, the test probe interior comprising a unitary elongated arm member and having:
• a pair of generally planar and parallel side surfaces extending along a longitudinal axis;
• a rear end portion for connecting to a test circuit;
• a front end portion for contacting a circuit to be tested comprising an upwardly extending tip;
• and
• a rear- and a front-central portion, the rear central portion adjacent the rear end portion, the front central portion between the rear central portion and the front end portion, the front central portion having a hole extending through the arm between the side surfaces;
• and
• coating the test probe interior with an electrically conductive material.

A method of testing a microcircuit comprising the steps of:

• providing a test probe comprising a unitary elongated electrically conductive arm member movably affixable to a retaining block and having:
• a pair of generally planar and parallel side surfaces extending along a longitudinal axis;
• a rear end portion for connecting to a test circuit;
• a front end portion for contacting a circuit to be tested comprising an upwardly extending tip;
• and
• a rear- and a front-central portion, the rear central portion adjacent the rear end portion, the front central portion between the rear central portion and the front end portion, the front central portion having a hole extending through the arm between the side surfaces;
• connecting the rear end portion of the test probe to a test circuit;
• contacting the test probe tip to a portion of a circuit to be tested;
• and
• performing a measurement based on a signal transmitted from the tip to the test circuit.