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US 2002/0171111 A1Published application
Semiconductor device
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsHideyo Haruhana, Yutaka Uneme, Seiji Yamamoto
Life of this patent
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Abstract
At least one diffusion region exists between a plurality of resistors formed on an element isolation layer, and the plurality of resistors and the diffusion regions are arranged such that all distances between the respective resistors and the diffusion regions around the corresponding resistors are equal to each other.
Claims20
A semiconductor device comprising:
- a plurality of resistors having the same characteristics formed on an element isolation layer;
- and
- at least one diffusion region between any two adjacent resistors,
- wherein the resistors and the diffusion regions are arranged such that a distance between the resistor and the diffusion region around that resistor are equal in case of all the registers.
1 more element
A semiconductor device comprising:
- a plurality of resistors having the same characteristics formed on an element isolation layer;
- and
- at least one metal wiring layer any two adjacent resistors,
- wherein the resistors and the metal wiring layers are arranged such that a distances between the resistor and the metal wiring layer around that resistor are equal in case of all the registers.
1 more element
Dependencies are inferred from the claim text.