Apparatus for characterizing material properties and method
OwnerLallit Anand, Brian P. Gearing +1inventors
InventorsLallit Anand, Brian P. Gearing, Sauri Gudlavalleti
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OwnerLallit Anand, Brian P. Gearing +1inventors
InventorsLallit Anand, Brian P. Gearing, Sauri Gudlavalleti
Estimating the term…
A testing apparatus has an integral load cell element. The apparatus may be used to characterize a property of a sample on, for example, the mesoscale. The apparatus has a frame, at least one actuator and at least one displacement sensor. The apparatus may further include a controller and data acquisition equipment. At least one portion of the frame defines at least one flexure element that is capable of being displaced, by the actuator or a sample, along a rectilinear axis. The frame defining the flexure element has a platform and at least two parallel beams or springs supporting the platform. The portion of the frame defining the flexure element tends to restrict displacement of the sample rectilinearly along an axis that is parallel to the applied force. The arrangement also provides a counter-rotating associated with a cantilever spring assembly. An indentation testing apparatus is has the capability to indent a sample with an indenter. A biaxial testing apparatus has the capability to apply a displacement along two axes. The actuators of the biaxial testing apparatus are de-coupled to remove interaction between the applied forces. The testing apparatus can be tailored to a specific characterization test by selecting an appropriate sample size, geometry, frame material, flexure element geometry, indenter, actuator and displacement sensor. The testing apparatus is capable of measuring 1 μN to 10 N forces with a resolution of 50 μN.
An apparatus for characterizing a property of a sample comprising:
An apparatus comprising a frame having a flexure element, the frame is constructed and arranged to be mountable on a surface that is changeable by a user from a first orientation to a second orientation.
An apparatus comprising:
An apparatus for characterizing a sample, the apparatus capable of applying a force to the sample between about 1 μN and about 10 N with a resolution of less than about 50 μN.
An apparatus comprising:
An apparatus for characterizing a sample comprising:
An apparatus for characterizing a sample comprising:
An apparatus for characterizing a sample comprising:
An apparatus for characterizing a sample comprising:
An apparatus for characterizing a sample comprising:
An apparatus for characterizing a sample comprising:
An apparatus for characterizing a sample comprising:
A method comprising:
A method for characterizing a sample comprising:
A method for characterizing a sample comprising:
A method for characterizing a sample comprising:
An apparatus for characterizing a sample comprising:
A method for producing a testing apparatus comprising:
An apparatus comprising:
Dependencies are inferred from the claim text.