Electronic device and defect repair method thereof
AssigneeInternational Business Machines Corporation
InventorsKazumitsu Imahara, Kakehiko Wada
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AssigneeInternational Business Machines Corporation
InventorsKazumitsu Imahara, Kakehiko Wada
Estimating the term…
A method is described for repairing failure points, regions or locations in an electronic device to have a perfect function when a semiconductor device including an LCD or other electronic device has defects. Described is a method of transferring a single or multi-layer thin film piece into a recess with the physical properties of the thin film piece unchanged. An electronic device is described incorporating a substrate; and a plurality of thin films laminated on the substrate and part of the thin films are formed on a predetermined circuit pattern, wherein a transfer film for repairing a defect is fitted into a recess where the low layers of the thin films are exposed by removing part of a single or multi-layer thin films covering a defective portion included on the thin films and its surrounding portion. Further, a method of repairing a defective portion included in the electronic device comprises the steps of: removing the thin films covering the defective portion and its surrounding portion to form a recess and exposing the lower layers of the thin films; and fitting a transfer film into the recess to attach the transfer film onto the exposed thin films.
An electronic device, comprising:
A method of repairing a defective portion included in an electronic device in which a plurality of thin films are laminated on a substrate and part of said thin films are formed on a predetermined circuit pattern, comprising the steps of:
A defect repair apparatus for an electronic device, comprising:
Dependencies are inferred from the claim text.