Apparatus for and method of measuring jitter
AssigneeAdvantest Corporation
InventorsTakahiro Yamaguchi, Masahiro Ishida, Mani Soma
Life of this patent
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AssigneeAdvantest Corporation
InventorsTakahiro Yamaguchi, Masahiro Ishida, Mani Soma
Estimating the term…
A signal under measurement x(t) is transformed into a complex analytic signal zc(t), and an instantaneous phase of the xc(t) is estimated using the zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform Δ®(t) of the x(t), and the Δφ(t) is sampled at a timing close to a zero-crossing timing of the x(t) to obtain a timing jitter sequence. Then a difference sequence of the timing jitter sequence is calculated to obtain a period jitter sequence. The period jitter sequence is multiplied by a ratio T0/Tk,k+1 of the fundamental period T0 of the x(t) and the sampling time interval Tk,k+1 to make a correction of the period jitter sequence. A period jitter value of the x(t) is obtained from the corrected period jitter sequence.
An apparatus for measuring a jitter of a signal under measurement comprising:
A method of measuring a jitter of a signal under measurement comprising:
A method of measuring a jitter of a signal under measurement comprising:
Dependencies are inferred from the claim text.