Circuit for programming antifuse bits
AssigneeMicron Technology, Inc.
InventorsPatrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
Life of this patent
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Abstract
Circuitry for programming antifuse elements is provided which permits all antifuse elements in a bank to be programmed simultaneously, thereby enhancing the speed at which antifuse elements may be programmed. In one embodiment, a feedback circuit is associated with each antifuse element to stop the flow of current through the antifuse element once it is programmed. In another embodiment, circuitry is provided for generating a separate programming pulse for each antifuse element, which is selected for programming.
Claims10
An integrated circuit memory product comprising:
- at least one bank of antifuse elements in which the top plates of the antifuse elements are joined in a common connection to a programming voltage;
- a selection transistor in series with each antifuse element in the bank, the enablement of a particular selection transistor resulting in a path being provided for the programming of the antifuse element associated with the enabled selection transistor;
- and
- a feedback circuit associated with each antifuse element in the bank to stop the flow of current through its associated antifuse element once the antifuse element is programmed.
An integrated circuit memory product comprising:
- a plurality of banks of antifuse elements, each bank including a plurality of antifuse elements;
- circuitry for selecting one of the banks of antifuse elements for programming;
- and
- circuitry for providing a separate programming pulse to each of the antifuse elements in the selected bank that is to be programmed.
A method of verifying antifuses in a semiconductor memory, comprising:
- connecting the antifuse in series with a node;
- providing current to the node which is sufficient to charge the node from a first to a second voltage;
- and
- detecting whether (a) the node charges to the second voltage;
- or (b) remains at the first voltage thereby indicating that the antifuse is leaky.
Dependencies are inferred from the claim text.