US 2002/0163352 A1 · Externally induced voltage alterations for integrated circuit analysis

Abstract

A method and circuit for integrated circuit analysis. The apparatus includes an irradiation component configured to irradiate an integrated circuit, a constant voltage source, one or more current chokes placed between the constant voltage source and one or more connections to the integrated circuit, and one or more voltage amplifiers. The irradiation component introduces changes in the electrical state of the integrated circuit. The one or more voltage amplifiers produces a state signal relating to the changes introduced by the irradiation component in the integrated circuit. The current choke separates the function, a DC function, of supplying a voltage bias to the integrated circuit from the function, an AC function, of signal generation. This allows separate optimization of the two functions—the ability to correctly bias the integrated circuit and obtain high signal-to-noise ratios for the resulting signal. This optimization improves the sensing abilities of the circuit.

Claims20

Dependent claims

An apparatus for analyzing an integrated circuit, the apparatus comprising:

(a) a means for modulated irradiation of the integrated circuit, thereby introducing changes in the electrical state of the integrated circuit;
(b) a constant voltage source;
(c) one or more current chokes placed between the constant voltage source and one or more connections to the integrated circuit;
and
(d) one or more voltage amplifiers for producing a state signal relating to the changes introduced by the irradiation means in the integrated circuit.

2 more elements

Dependencies are inferred from the claim text.

Externally induced voltage alterations for integrated circuit analysis

Life of this patent

Externally induced voltage alterations for integrated circuit analysis

Life of this patent

Abstract

Claims20