Method for sampling and testing data centers for metallic particulates
AssigneeHewlett-Packard Development Company, L.P.
InventorsRalph A. Carbone, David J. Roche
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AssigneeHewlett-Packard Development Company, L.P.
InventorsRalph A. Carbone, David J. Roche
Estimating the term…
The present invention is drawn to methods for sampling and/or testing for the presence of whisker-like metallic particulates in data centers or computer rooms. For example, a method for discovering the presence of an undesired whisker-like metallic particulate in a data center is disclosed comprising providing a tool having a conductive adhesive portion wherein the conductive adhesive portion is capable of capturing and retaining the whisker-like metallic particulates in their fragile condition, locating a surface of the data center where metallic particulates may be present, extracting from the surface any whisker-like metallic particulates present in substantially their fragile condition using the tool, and confirming with an electron microscope whether or not any whisker-like metallic particulates are present on the conductive adhesive portion of the tool.
A method of sampling for the presence of fragile whisker-like metallic particulates in a data center comprising:
A method for discovering the presence of an undesired whisker-like metallic particulate in a data center comprising:
A method for discovering the presence of an undesired whisker-like metallic particulate in a data center comprising:
Dependencies are inferred from the claim text.