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US 2002/0162057 A1Published application
Data integrity monitoring storage system
AssigneeSun Microsystems, Inc.
InventorNisha D. Talagala
Life of this patent
Estimating the term…
Abstract
A storage device is monitored for data integrity errors and each detected data integrity error is stored in a count. When that count reaches a threshold limit, the storage device is placed into a forced failure state.
Claims44
A method of operating a storage device, comprising:
- detecting data integrity errors in the storage device;
- counting each data integrity error in a count;
- and
- when the count reaches a threshold limit, placing the storage device into a forced failure state.
1 more element
A storage system, comprising:
- a storage device;
- and
- a demerit monitor coupled to the storage device for detecting data integrity errors in the storage device, counting each data integrity error in a count, and when the count reaches a threshold limit, placing the storage device into a forced failure state.
A computer-readable medium whose contents cause a computer system to operate a storage device, by performing the steps of:
- detecting data integrity errors in the storage device;
- counting each data integrity error in a count;
- and
- when the count reaches a threshold limit, placing the storage device into a forced failure state.
1 more element
Dependencies are inferred from the claim text.