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US 2002/0159145 A1Published application
Microscope with an illumination for a control element
AssigneeLeica Microsystems Heidelberg GmbH
InventorJuergen Hoffmann
Life of this patent
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Abstract
Microscope (1) for investigating a sample having a light source (7), which emits illumination light (19) of at least one illumination wavelength for illumination the sample (15) and at least one control element (61 to 71). The microscope is characterized in that the control element (61 to 71) is visible in darkness.
Claims11
A microscope for investigating a sample comprises:
- a light source defining an illumination source wherein the light source emits an illumination light of at least one illumination wave length for illumination the sample;
- and at least one control element, which is visible in darkness by emitting light, wherein the emitted light has a wave length which is different to the illumination wave length.
A scanning microscope or a confocal scanning microscope for investigating a sample comprises:
- a light source defining an illumination source wherein the light source emits an illumination light of at least one illumination wave length for illumination the sample;
- and
- at least one control element, which is visible in darkness by emitting light, wherein the emitted light has a wave length which is different to the illumination wave length.
Dependencies are inferred from the claim text.