Apparatus and method for testing linearity of an analog to digital converter
AssigneeSamsung Electronics Co., Ltd.
InventorsJung-Hoon Oh, Byeong-Hwan Cho
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AssigneeSamsung Electronics Co., Ltd.
InventorsJung-Hoon Oh, Byeong-Hwan Cho
Estimating the term…
A tester and method for testing linearity of an analog to digital converter without being influenced by noise, includes a controller that outputs a sampling frequency clock to convert an analog signal into a digital signal, that digitally filters the digitized code value, that generates a histogram responsive to the filtered digitized code value according to a predetermined program, and that controls display of the histogram; a signal generator that generates ground voltage and a triangular wave signal; an analog to digital converter that converts the analog triangular wave signal generated by the signal generator into a digital signal and that outputs the digital signal; a memory that stores the digitized code value converted by the analog to digital converter under control of the controller; and a display that displays the histogram related to the digitally filtered code value generated under control of the controller.
An apparatus for testing linearity of an analog to digital converter, comprising:
An apparatus for testing linearity of an analog to digital converter, comprising:
A method of testing linearity of an analog to digital converter, comprising:
Dependencies are inferred from the claim text.