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US 2002/0158650 A1Published application
Device testing using a holding-circuit
AssigneeIntel Corporation
InventorBradley A. Bloechel
Life of this patent
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Abstract
Techniques for testing devices include generating event signals and producing response signals in a device under test (DUT) in response to the event signals. The event signals are stored in a holding circuit. The DUT is evaluated based on the response signals from the DUT and stored event signals received from the holding circuit.
Claims27
A method comprising:
- generating event signals;
- storing the event signals in a holding circuit;
- producing response signals in a device under test (DUT) in response to the event signals;
- and
- evaluating the DUT based on the response signals from the DUT and stored event signals received from the holding circuit and.
2 more elements
An apparatus comprising:
- a driving circuit including an input and an output;
- a first conductor including a first end and a second end;
- a first input port for receiving a trigger signal coupled to the input of the driving circuit;
- a second input port for receiving an event signal coupled to the first end of the first conductor;
- an output port for outputting a hold signal coupled to the second end of the first conductor;
- and
- a second conductor, having an impedance higher than an impedance of the first conductor, and coupled between the output of the driving circuit and a connection point on the first conductor.
4 more elements
A system comprising:
- a signal source for generating event signals and trigger signals;
- a holding circuit for receiving the event signals and trigger signals, and for capturing the event signals;
- a device under test (DUT) for producing response signals in response to the event signals;
- and
- a measuring device for evaluating the DUT based on the response signals from the DUT and captured event signals from the holding circuit.
2 more elements
Dependencies are inferred from the claim text.