Model -based localization and measurement of miniature surface mount components
AssigneeSiemens Corporation Research, Inc.
InventorsJenn-Kwei Tyan, Ming Fang
Life of this patent
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AssigneeSiemens Corporation Research, Inc.
InventorsJenn-Kwei Tyan, Ming Fang
Estimating the term…
A system and method for object inspection includes an object modeler; an iterative object segmentor in signal communication with the object modeler for receiving an input image and model parameters and producing a segmented image; a moment transformer in signal communication with the iterative object segmentor for receiving an input image, model parameters and a segmented image and producing estimates of object translation, rotation and scaling; an edge detector and interpolator in signal communication with the moment transformer for receiving an input image, model parameters and estimates and producing a set of line edges; and an iterative optimizer in signal communication with the edge detector and interpolator for receiving an input image, model parameters, estimates and line edges and producing refined estimates of object translation, rotation and scaling.
An object inspection method comprising:
An object inspection system comprising:
A program storage device readable by machine, tangibly embodying a program of instructions executable by the machine to perform method steps for automatically detecting nodules from image data, the method steps comprising:
An object inspection system comprising:
Dependencies are inferred from the claim text.