X-Ray fluorescence analyzer
AssigneeNiton Corporation
InventorsLee Grodzins, Hal Grodzins
Life of this patent
Estimating the term…
Abstract
An x-ray fluorescence analyzer and method. The analyzer and method use a single radio-active source, such as, 241Am to determine the composition of a metal alloy or precious metal. The method compensates for Rayleigh scattering by first determining a scaling factor using a particular energy line in the spectrum of the test material and comparing that line to the same energy line for a pure metal. Based on the scaling factor the energy spectrum for the pure is compensated and then subtracted from the energy spectrum of the test material at discrete points.
Claims38
A device for analyzing a test material, the device comprising:
- a single radioactive source emitting radiation having Rayleigh scattered intensities that overlap with characteristic x-rays of the test material;
- an energy detector for receiving fluoresced radiation from the test material;
- and
- electronics coupled to the energy detector for determining the composition of the test material based at least upon the fluoresced radiation.
A method for analyzing a test material, the method comprising:
- providing a single radioactive material emitting both x-rays and gamma rays, wherein the single radioactive material is 241Am;
- exposing the test material to the x-rays and gamma rays of the radioactive material;
- receiving fluoresced radiation into an energy detector;
- and
- determining the composition of the test material in a processor based in part upon the received fluoresced radiation from the x-rays and gamma rays of the 241Am.
A method for analyzing a test material, the method comprising:
- subjecting the test material to radiation produced by a single source, wherein the source has Rayleigh scattered intensities that overlap with characteristic x-rays of the test material;
- measuring an energy spectrum of the fluoresced radiation of the test material in an energy detector;
- compensating for the Rayleigh scattered intensities in the energy spectrum of the fluoresced radiation creating a compensated energy spectrum;
- and
- determining the composition of the test material based upon the compensated energy spectrum.
A computer program product readable by a computer processor and having computer code thereon, for analyzing a test material, the computer code comprising:
- computer code for receiving an energy spectrum of fluoresced radiation of the test material which is exposed to a single radiation source having Rayleigh scattered intensities that overlap with characteristic x-rays of the test material;
- computer code for compensating for the Rayleigh scattered intensities in the energy spectrum creating a compensated energy spectrum;
- and
- computer code for determining the composition of the test material based upon the compensated energy spectrum.
Dependencies are inferred from the claim text.